The basis of the 3D Gannen probe is a silicon chip with integrated piezo resistive elements. One point probing and scanning is possible with ultra low uncertainty. The probe is lightweight with a colliding mass of approximately 34 mg. Combined with a stiffness down to 150 N/m this allows high speed measurements with probing forces down to a few micro Newtons, depending on the CMM used.

The probe is calibrated to establish the relation between the probe tip displacement and the signal as measured by the piezo resistive strain gauges. The calibration can be performed on the Coordinate Measuring Machine (CMM) itself or by XPRESS Precision Engineering.

Measurements using the XPRESS probe shown a 3D uncertainty of 50 nm and a 1D repeatability of 2 nm or less (standard deviation). The drift of the probe is mainly caused by temperature variations. For temperature variation of 0,1 K or less, comparable to the environment in a low uncertainty Coordinate Measuring Machine, the drift is approximately 10 nm.
More measurement results with the Gannen probe...

The probe itself will break, when the measurement range exceeds approximately 200 micrometers. The range of today's high accuracy CMM's varies around 7 micrometers. Breaking of the probe will therefore only occur as a result of faulty operator handling or control errors of the CMM. In the latter case damage to the workpiece is prevented by a break-off of the probe. Should this happen the sensor needs to be replaced. A skilled operator at your company can easilly replace the sensor in a matter of seconds.