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Measurement uncertainty


The uncertainty of the Gannen probe is influenced by its repeatability, thermal drift, tip deviations and workpiece deformation. The combined 3D uncertainty of the sensor is 50 nm.


Uncertainty budget for the Gannen XP probe

3D sensor uncertainty (k=3) ** 10 nm
Calibration of tip and probe *** 40 nm
Temperature deviations (ΔT < 0,1 K) < 10 nm
Tip and work piece deformation < 10 nm
Other deviations < 10 nm
Combined 3D uncertainty 45 nm

* The analysis is based on three times the standard deviation (k=3) and a maximum displacement of the sensor tip of 10 micrometers in a temperature controlled environment, where temperature variations are within plusminus 0,1 K

** the stated value is mainly determined by machine uncertainty and calibration method

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Product overview
Gannen series
Heimen series
Design & support
Measurement results
Probe repeatability
Temperature effects
Uncertainty
Probe calibration
Calibration setup
Frequently Asked Questions

Gannen-XP used in a nanometrology measurement on an artefact.

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