An overview of some of the articles with respect to Xpress Precision Engineering and the Gannen probes (also known as 'nano probe') is given on this page.

	Drs. Jan Westerink joins advisory board Xpress (3-7-2008)
	Bos appointed officer at Dutch Society of Precision Engineering (1-6-2008)
	Symposium: Knowledge = Money (10-1-2008)
	Gannen-XM now available (1-1-2008)
	Xpress Precision Engineering has moved (1-11-2007)
	STW Valorisation Grant 2007 awarded (7-7-2007)
	Xpress wins grand final of New Venture 2007 (28-6-2007)
	Xpress featured in 'Best of Brainport' on RTV10 (3-6-2007)
	Xpress wins round 2 of New Venture 2007 (30-3-2007)
	Archived news items...

	Mikroniek: Nanometre level uncertainty with the Gannen XP (pdf, 0.9 Mb) (2008, nr. 3, pp. 28)
	Mechatronica Magazine: Xpress maakt 3D-microscans met nanoprecisie (pdf, 1.3 Mb) (2008) in Dutch
	Small Times: Gannen-XM provides "true" measurement of MEMS, micro objects (17-1-2008)
	Engineering talk: Measuring device suits tiny components (1-2-2008)
	MEMSinfo.jp: Measuring MEMS with the Gannen XM (17-1-2008) in Japanese
	Elinform.ru: Gannen-XM measures MEMS (21-1-2008) in Russian
	Nobiles Magazine: Het begin van een nieuw meettijdperk (pdf, 0.5 Mb) (2007) in Dutch
	Precisietechnologie Jaarboek 2007: Nano-meettaster (pdf, 1.3 Mb) (2007) in Dutch
	Technisch Weekblad: Xpress richt zich op hoog-nauwkeurige meettaken (pdf, 0.3 Mb) (2007) in Dutch
	Vector: Meten op Nanoschaal (pdf, 0.4 Mb) (2007) in Dutch

	Gannen product brochure (Download/Xpress-Gannen.pdf, 0.24 Mb)
	Terms and conditions of commercial sale

High-accuracy CMM metrology for micro products, IMEKO conference, 2004. (Download/Xpress_Imeko_2004.pdf, 1.1 Mb)

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